X-RAY-DIFFRACTION ANALYSIS OF LATTICE STRAIN IN METALLIC SUPERLATTICEFILMS

Citation
N. Nakayama et al., X-RAY-DIFFRACTION ANALYSIS OF LATTICE STRAIN IN METALLIC SUPERLATTICEFILMS, Journal of magnetism and magnetic materials, 126(1-3), 1993, pp. 71-75
Citations number
14
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
03048853
Volume
126
Issue
1-3
Year of publication
1993
Pages
71 - 75
Database
ISI
SICI code
0304-8853(1993)126:1-3<71:XAOLSI>2.0.ZU;2-Q
Abstract
In-plane lattice spacings of [Au(xangstrom)/Ni(xangstrom)] and [Pd(xan gstrom)/Cu(xangstrom)] superlattice films with [III]fcc textures and l arge lattice misfits have been measured by X-ray diffraction. With dec rease of superlattice period (LAMBDA = 2x), Au and Pd layers are compr essed whereas Ni and Cu layers are expanded. The observed lattice spac ings (d220) of the individual layers vary almost linearly depending on 1/LAMBDA. The lattice spacings of two constituent layers become equal in a Au/Ni superlattice with LAMBDA = 8 angstrom (d220 = 1.371 angstr om) and a Pd/Cu superlattice with LAMBDA = 14 angstrom (d220 = 1.337 a ngstrom).