MAGNETIC DEPTH PROFILES OF MAGNETIC MULTILAYERS FE SI AND FE/W USING POLARIZED NEUTRON REFLECTOMETRY/

Authors
HOMMA H ANKER JF MAJKRZAK CF
Citation
H. Homma et al., MAGNETIC DEPTH PROFILES OF MAGNETIC MULTILAYERS FE SI AND FE/W USING POLARIZED NEUTRON REFLECTOMETRY/, Journal of magnetism and magnetic materials, 126(1-3), 1993, pp. 257-260
Citations number
11
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Journal of magnetism and magnetic materials → ACNP
ISSN journal
03048853
Volume
126
Issue
1-3
Year of publication
1993
Pages
257 - 260
Database
ISI
SICI code
0304-8853(1993)126:1-3<257:MDPOMM>2.0.ZU;2-L
Abstract
We have studied the magnetic properties and roughness at interfaces of sputtered magnetic multilayers Fe/Si and Fe/W, employing a newly deve loped magnetic profile refinement program for polarized neutron reflec tivity data. This modeling demonstrates the capability to measure magn etic moment depth profiles near interfaces quantitatively.