OPTICAL-PROPERTIES AND GROWTH-PROCESS OF NI CU BILAYER FILMS STUDIED BY IN-SITU ELLIPSOMETRY/

Authors
KAWAGOE T MIZOGUCHI T
Citation
T. Kawagoe et T. Mizoguchi, OPTICAL-PROPERTIES AND GROWTH-PROCESS OF NI CU BILAYER FILMS STUDIED BY IN-SITU ELLIPSOMETRY/, Journal of magnetism and magnetic materials, 126(1-3), 1993, pp. 538-540
Citations number
6
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Journal of magnetism and magnetic materials → ACNP
ISSN journal
03048853
Volume
126
Issue
1-3
Year of publication
1993
Pages
538 - 540
Database
ISI
SICI code
0304-8853(1993)126:1-3<538:OAGONC>2.0.ZU;2-V
Abstract
Bilayer films of Ni/Cu were investigated by in-situ ellipsometry durin g deposition. The results were analyzed by a multiple reflection model with effective reflection coefficient at the interface which was affe cted by the intermixing of Ni and Cu.