T. Kawagoe et T. Mizoguchi, OPTICAL-PROPERTIES AND GROWTH-PROCESS OF NI CU BILAYER FILMS STUDIED BY IN-SITU ELLIPSOMETRY/, Journal of magnetism and magnetic materials, 126(1-3), 1993, pp. 538-540
Bilayer films of Ni/Cu were investigated by in-situ ellipsometry durin
g deposition. The results were analyzed by a multiple reflection model
with effective reflection coefficient at the interface which was affe
cted by the intermixing of Ni and Cu.