FAR-IR SPECTROSCOPIC ELLIPSOMETER

We have built a far-IR ellipsometer which combines the methods of Four ier transform IR (FTIR) spectroscopy and rotating analyser ellipsometr y. The instrument is based on a Bruker FTIR spectrometer to which we,a ttached an ellipsometer chamber. The spectral range is 30-600 cm-1. A variable-temperature cryostat enables us to make low temperature measu rements down to 20 K. Initial results on the pseudodielectric function of Si:P and YBa2Cu3O7 are in good agreement with literature data.