Pj. Roussel et al., NUMERICAL ASPECTS OF THE IMPLEMENTATION OF EFFECTIVE-MEDIUM APPROXIMATION MODELS IN SPECTROSCOPIC ELLIPSOMETRY REGRESSION SOFTWARE, Thin solid films, 234(1-2), 1993, pp. 423-427
Results are presented of a study of the numerical aspects of the imple
mentation of different effective-medium approximation models in spectr
oscopic ellipsometry regression software. Straightforward solution of
the refractive index from the equations describing the dielectric cons
tant of mixed layers presented by Bruggeman often requires careful sel
ection of the proper branch from a multivalued inverse of a complex fu
nction. Transform methods are applied that considerably simplify the r
adicand formulations. It is shown that the principal branch of the com
plex functions involved always yields the correct refractive index for
any proportion of the materials mixed, leading to efficient vectoriza
ble computer code.