ELLIPSOMETRIC SPECTRA AND FRACTIONAL DERIVATIVE SPECTRUM ANALYSIS OF POLYANILINE FILMS

Citation
D. Mo et al., ELLIPSOMETRIC SPECTRA AND FRACTIONAL DERIVATIVE SPECTRUM ANALYSIS OF POLYANILINE FILMS, Thin solid films, 234(1-2), 1993, pp. 468-470
Citations number
14
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
234
Issue
1-2
Year of publication
1993
Pages
468 - 470
Database
ISI
SICI code
0040-6090(1993)234:1-2<468:ESAFDS>2.0.ZU;2-#
Abstract
Ellipsometric spectra of polyaniline films were measured for the first time. The complex dielectric function and the refractive index in the UV-visible range of both insulating and conducting polyaniline were o btained. The spectral structure was analysed with emphasis on the evol ution of the electronic structure from an insulating to a conducting p olymer. The threshold energy and the broadening parameter as well as t he dimension are determined by the fractional derivative spectrum tech nique which was previously proposed by X.-F. He and D. Mo (Chin. Phys. Lett., 3 (1986) 565).