ELLIPSOMETRY AND REFLECTIVITY AT THE BREWSTER-ANGLE - TOOLS TO STUDY THE BENDING ELASTICITY AND PHASE-TRANSITIONS IN MONOLAYERS AT LIQUID INTERFACES

Authors
HENON S MEUNIER J
Citation
S. Henon et J. Meunier, ELLIPSOMETRY AND REFLECTIVITY AT THE BREWSTER-ANGLE - TOOLS TO STUDY THE BENDING ELASTICITY AND PHASE-TRANSITIONS IN MONOLAYERS AT LIQUID INTERFACES, Thin solid films, 234(1-2), 1993, pp. 471-474
Citations number
12
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
234
Issue
1-2
Year of publication
1993
Pages
471 - 474
Database
ISI
SICI code
0040-6090(1993)234:1-2<471:EARATB>2.0.ZU;2-G
Abstract
In recent years, two non-perturbative techniques derived from ellipsom etry and reflectivity at the Brewster angle have been developed to stu dy monolayers at liquid interfaces. The first is an ellipsometric meth od to measure the bending elastic modulus of monolayers at the oil-wat er interfaces. The second is microscopy at the Brewster angle.