SPECTROSCOPIC ELLIPSOMETRIC AND MAGNETOOPTICAL STUDY OF CU FE MULTILAYERS/

Authors
KUDRYAVTSEV YV BZHESTOWSKI OY SMARDZ L
Citation
Yv. Kudryavtsev et al., SPECTROSCOPIC ELLIPSOMETRIC AND MAGNETOOPTICAL STUDY OF CU FE MULTILAYERS/, Thin solid films, 234(1-2), 1993, pp. 536-537
Citations number
8
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
234
Issue
1-2
Year of publication
1993
Pages
536 - 537
Database
ISI
SICI code
0040-6090(1993)234:1-2<536:SEAMSO>2.0.ZU;2-D
Abstract
Optical and magneto-optical properties of Cu/Fe multilayers (MLs) with different lengths of modulation were investigated in a wide wavelengt h range at 293 K. The observed slight discrepancies between experiment al optical conductivity spectra and their computer simulation for Cu/F e MLs with a rectangular profile of modulation may be explained by the appearance of an ultrathin layer with mixed components at the interfa ce. It was shown that off-diagonal components of the dielectric tensor for Cu/Fe MLs with ''thin'' Fe layers differ from corresponding compo nents for the bulk Fe.