Light-induced defect creation is demonstrated in hydrogenated polycrys
talline silicon (poly-Si:H). The newly created defects are metastable
as in hydrogenated amorphous silicon (a-Si:H). However, unlike a-Si:H
the magnitude of the light-induced degradation decreases with repeated
illumination and anneal cycles and is restored upon reexposure to mon
atomic hydrogen. This unique response arises from the inherent structu
ral inhomogeneity of the polycrystalline material and establishes that
hydrogen directly contributes to the metastability in poly-Si:H.