Sg. Oh et Nm. Rodriguez, IN-SITU ELECTRON-MICROSCOPY STUDIES OF THE INHIBITION OF GRAPHITE OXIDATION BY PHOSPHORUS, Journal of materials research, 8(11), 1993, pp. 2879-2888
A combination of in situ transmission electron microscopy and thermogr
avimetric techniques has been used to follow the manner by which phosp
horus addition to graphite influences its interaction with oxygen. Dir
ect observation of the process shows that the additive completely inhi
bits the reaction at temperatures below 830-degrees-C. At higher tempe
ratures phosphorus species are found to bond preferentially to the gra
phite ''armchair'' {1120}BAR faces leaving the ''zigzag'' {1010}BAR fa
ces vulnerable to attack by oxygen. In situ electron diffraction analy
sis indicates the formation of a chemical bond between the phosphorus
and graphite edge atoms at high temperatures, which involves the forma
tion of a complex believed to become an integral part of the structure
. This unique type of chemical bonding is believed to be responsible f
or the observed thermal stability of P-O species on the graphite atoms
at temperatures up to 1050-degrees-C. In a further series of experime
nts, phosphorus was found to poison the catalytic activity of cobalt,
which in its unadulterated state is a very effective promoter of the g
raphite-oxygen reaction.