SCANNING PROBE MICROSCOPY FOR INDUSTRIAL APPLICATIONS - SELECTED EXAMPLES

Citation
U. Dammer et al., SCANNING PROBE MICROSCOPY FOR INDUSTRIAL APPLICATIONS - SELECTED EXAMPLES, Scanning, 15(5), 1993, pp. 257-264
Citations number
11
Categorie Soggetti
Microscopy
Journal title
ISSN journal
01610457
Volume
15
Issue
5
Year of publication
1993
Pages
257 - 264
Database
ISI
SICI code
0161-0457(1993)15:5<257:SPMFIA>2.0.ZU;2-M
Abstract
Some examples are selected to demonstrate the variety of possible scan ning probe microscopy application in industry. Magnetic and magnetoopt ical storage media can be investigated by magnetic force microscopy, w hereas a conventional scanning force microscope is used to examine sur face features of many different materials, such as technical glasses, photosensitive materials, new superconductors, and biomolecules. Some other examples include the modification as well as the observation of liquid crystal devices, and the impact that scanning probe microscopy has on other techniques such as high precision stepping motors and hig h quality electron beam sources.