APPLICATIONS OF SCANNING PROBE MICROSCOPIES IN TECHNOLOGY AND MANUFACTURING

Citation
G. Persch et al., APPLICATIONS OF SCANNING PROBE MICROSCOPIES IN TECHNOLOGY AND MANUFACTURING, Scanning, 15(5), 1993, pp. 283-290
Citations number
13
Categorie Soggetti
Microscopy
Journal title
ISSN journal
01610457
Volume
15
Issue
5
Year of publication
1993
Pages
283 - 290
Database
ISI
SICI code
0161-0457(1993)15:5<283:AOSPMI>2.0.ZU;2-B
Abstract
Within the last 10 years the scanning probe microscopies (SPMs) have b een applied to a variety of problems with the main emphasis on scienti fic applications. The SPM techniques have to date also found their tec hnical applications. The simple concept can easily be adapted to a var iety of different applications in high technologic manufacturing proce sses. The scanning tunneling microscope is now considered as a standar d measuring equipment, in the meantime there exists a whole family of SPMs with promising applications in not only a pure scientific environ ment but also in a manufacturing environment. As examples for industri al applications, we report on magnetic force microscopic investigation s, on magnetic storage device components, and on a relatively new tech nique for nanohardness investigations of thin-films by an atomic force microscope.