Within the last 10 years the scanning probe microscopies (SPMs) have b
een applied to a variety of problems with the main emphasis on scienti
fic applications. The SPM techniques have to date also found their tec
hnical applications. The simple concept can easily be adapted to a var
iety of different applications in high technologic manufacturing proce
sses. The scanning tunneling microscope is now considered as a standar
d measuring equipment, in the meantime there exists a whole family of
SPMs with promising applications in not only a pure scientific environ
ment but also in a manufacturing environment. As examples for industri
al applications, we report on magnetic force microscopic investigation
s, on magnetic storage device components, and on a relatively new tech
nique for nanohardness investigations of thin-films by an atomic force
microscope.