Rm. Feenstra et al., TUNNELING SPECTROSCOPY OF MIDGAP STATES INDUCED BY ARSENIC PRECIPITATES IN LOW-TEMPERATURE-GROWN GAAS, Applied physics letters, 63(18), 1993, pp. 2528-2530
The scanning tunneling microscope is used to study arsenic precipitate
s in low-temperature-grown and annealed GaAs. Tunneling spectroscopy r
eveals a distribution of states throughout the band pp, arising from t
he precipitates, with the density of midgap states increasing as the p
recipitate size increases. The Fermi level is found to be pinned at E(
V)+0.65 eV for 600-degrees-C annealed material. For 800-degrees-C anne
aled material the Fermi level is located at E(V)+1.05 eV in regions fa
r from precipitates, and additional depletion regions are observed nea
r the precipitates.