Em. Verbitskaya et al., EFFECT OF DEUTERON IRRADIATION ON RADIATION DETECTORS MADE OF HIGH-RESISTIVITY SILICON, Semiconductors, 27(7), 1993, pp. 612-616
Radiation defects formed by deuterons in radiation detectors made of h
igh-resistivity n-type Si have been studied. The effects of deuteron a
nd alpha-particle irradiation were compared. The results indicate that
annealing can reduce the reverse current in the irradiated detectors.
The observed effects were explained by the presence of large multicom
ponent complexes.