D. Tanaka et al., ANODIC POLARIZATION BEHAVIOR AND SURFACE- FILMS OF CVD-SIC IN AQUEOUS-SOLUTIONS, Nippon Kinzoku Gakkaishi, 57(10), 1993, pp. 1166-1173
The anodic polarization behavior of SiC prepared by CVD has been exami
ned in 1 kmol.m(-3) H2SO4(pHO), phosphate buffer solution (pH6.86), bo
ric-borate buffer solution(pH8.45) and 0.1 kmol.m(-3) NaOH(pH12.8). Gr
owth and composition of the surface film formed by the anodic polariza
tion have been measured by ellipsometry, XPS, and IR spectroscopy. Max
imum dissolution current densities under the anodic polarization were
less than 1 A.m(-2) in the solutions. This shows the corrosion rate of
SiC is quite small in the solutions. The corrosion rate of SiC increa
sed with increasing the pH value oi solutions. The anodic oxidation fi
lms which was estimated to be a hydrated amorphous SiO2 by XPS and IR
spectroscopy were formed on SiC in the acid and neutral solutions, whe
reas no film growth was found in the alkaline solution. The potential
at which the formation of anodic oxidation film starts became lower wi
th increasing pH. The conversion of composition of the SiC matrix occu
rred under the anodic oxidation film when SiC was polarized to higher
potentials. This converted matrix layer was composed of carbon-rich Si
C and its refractive index was lower than that of the original SiC mat
rix.