ANALYSIS OF BENDING DISPLACEMENT OF LEAD-ZIRCONATE-TITANATE THIN-FILMSYNTHESIZED BY HYDROTHERMAL METHOD
Citation
Y. Ohba et al., ANALYSIS OF BENDING DISPLACEMENT OF LEAD-ZIRCONATE-TITANATE THIN-FILMSYNTHESIZED BY HYDROTHERMAL METHOD, JPN J A P 1, 32(9B), 1993, pp. 4095-4098
Categorie Soggetti
Physics, Applied
Abstract
Lead zirconate titanate solid-solution (PZT) films with various thickn
esses were synthesized on titanium substrates by repeated hydrothermal
treatments. Young's modulus and the density of the PZT film were meas
ured by the vibrating-reed technique and Archimedes' method, respectiv
ely, and they were lower than those of PZT ceramic. We fabricated bimo
rph-type bending actuators using those films and analyzed the displace
ment induced by the electric field. It was found that the piezoelectri
c constant and electromechanical coupling factor of the PZT film were
comparable to those of the ceramic, and also that the displacement was
caused by the piezoelectric effect. The actuators were bent by applie
d voltage without poling, because the polar axes in the as-deposited f
ilm were aligned in the direction from the film surface to the substra
te.