ATOMIC-FORCE MICROSCOPY STUDY OF CUBIC AND OCTAHEDRAL AGBR MICROCRYSTALS

Atomic force microscopy (AFM) has been used to study monodisperse cubi c and octahedral AgBr microcrystals, which are essential components of modem photographic materials. Using AFM, detailed information about s hape and surface morphology of these microcrystals can be obtained dir ectly with high lateral, as well as vertical, resolution. Critical emu lsion parameters, such as diameter, height, and surface roughness, hav e been determined for individual microcrystals. The results are discus sed with regard to principal questions related to AFM measurements on precipitated emulsion particles.