TRANSVERSE KERR MAGNETOMETRY FOR THE STUDY OF THIN-FILMS PRESENTING PERPENDICULAR AND INPLANE ANISOTROPY

Authors
RIVAS M CALLEJA JF CONTRERAS MC
Citation
M. Rivas et al., TRANSVERSE KERR MAGNETOMETRY FOR THE STUDY OF THIN-FILMS PRESENTING PERPENDICULAR AND INPLANE ANISOTROPY, Journal of magnetism and magnetic materials, 166(1-2), 1997, pp. 53-58
Citations number
6
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Journal of magnetism and magnetic materials → ACNP
ISSN journal
03048853
Volume
166
Issue
1-2
Year of publication
1997
Pages
53 - 58
Database
ISI
SICI code
0304-8853(1997)166:1-2<53:TKMFTS>2.0.ZU;2-H
Abstract
A model for the behaviour of transverse initial susceptibility as a fu nction of de applied field is developed for the case of thin films exh ibiting simultaneous in-plane and perpendicular anisotropy. It is used to deduce in-plane and perpendicular anisotropy fields in a very simp le way from transverse susceptibility measurements made by the transve rse Ken: effect, The results obtained are cross-checked by those obtai ned from magnetization curves.