MASKLESS WRITING OF SUBMICROMETER GRATINGS IN FUSED-SILICA BY FOCUSEDION-BEAM IMPLANTATION AND DIFFERENTIAL WET ETCHING

Citation
J. Albert et al., MASKLESS WRITING OF SUBMICROMETER GRATINGS IN FUSED-SILICA BY FOCUSEDION-BEAM IMPLANTATION AND DIFFERENTIAL WET ETCHING, Applied physics letters, 63(17), 1993, pp. 2309-2311
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
63
Issue
17
Year of publication
1993
Pages
2309 - 2311
Database
ISI
SICI code
0003-6951(1993)63:17<2309:MWOSGI>2.0.ZU;2-F
Abstract
Surface relief gratings with submicrometer periods have been fabricate d in silica by ion implantation with a focused ion beam, followed by e tching in diluted hydrofluoric acid. Implanted silica etches three tim es faster than unimplanted silica and groove depths of the order of 30 0 nm have been achieved. The method does not require photolithography or masking layers, allows arbitrary patterns to be defined, and may be used to fabricate diffractive optical elements or grating filters in optical waveguides.