Deposition of three dimensional particles on flat single crystalline s
urface results in appearance of transmission diffraction features. Ana
lysis of diffraction patterns gives a possibility to characterize in s
itu the particle structure and orientation as well as to determine the
variation of lattice parameter during particle growth. We have used t
he RHEED-system equipped with a data acquisition tool permitting both
image processing and real time analysis. Different mode of epitaxy and
lattice parameter variations were observed. The RHEED results were co
rrelated with ex situ observations of particle size by means of Transm
ission Electron Microscopy (TEM).