DETERMINATION OF CONCENTRATION-DEPENDENT DIFFUSION-COEFFICIENTS IN AMORPHOUS NI-P FILMS STUDIED BY AUGER-ELECTRON DEPTH PROFILING

Authors
BUKALUK A
Citation
A. Bukaluk, DETERMINATION OF CONCENTRATION-DEPENDENT DIFFUSION-COEFFICIENTS IN AMORPHOUS NI-P FILMS STUDIED BY AUGER-ELECTRON DEPTH PROFILING, Czechoslovak journal of Physics, 43(9-10), 1993, pp. 887-891
Citations number
18
Categorie Soggetti
Physics
Journal title
Czechoslovak journal of Physics → ACNP
ISSN journal
00114626
Volume
43
Issue
9-10
Year of publication
1993
Pages
887 - 891
Database
ISI
SICI code
0011-4626(1993)43:9-10<887:DOCDIA>2.0.ZU;2-8
Abstract
Studies of the interdiffusion in ion-plated Ni100-xPx/Ni100-yPy thin f ilms are described. The diffusion coefficients are evaluated from dept h profiles obtained by using Auger electron spectroscopy (AES). The we ll-known Boltzmann-Matano method is applied for extraction of the diff usion coefficients from the depth profile data. The results show a str ong composition dependence.