A. Bukaluk, DETERMINATION OF CONCENTRATION-DEPENDENT DIFFUSION-COEFFICIENTS IN AMORPHOUS NI-P FILMS STUDIED BY AUGER-ELECTRON DEPTH PROFILING, Czechoslovak journal of Physics, 43(9-10), 1993, pp. 887-891
Studies of the interdiffusion in ion-plated Ni100-xPx/Ni100-yPy thin f
ilms are described. The diffusion coefficients are evaluated from dept
h profiles obtained by using Auger electron spectroscopy (AES). The we
ll-known Boltzmann-Matano method is applied for extraction of the diff
usion coefficients from the depth profile data. The results show a str
ong composition dependence.