REENTRANCE AND SPIN-GLASS BEHAVIOR IN CDCR2-XINXSE4 THIN-FILMS - DYNAMICAL STUDIES

Authors
KIM YH BHAGAT SM MANHEIMER MA MAKSYMOWICZ LJ LUBECKA M
Citation
Yh. Kim et al., REENTRANCE AND SPIN-GLASS BEHAVIOR IN CDCR2-XINXSE4 THIN-FILMS - DYNAMICAL STUDIES, Journal of magnetism and magnetic materials, 127(1-2), 1993, pp. 129-134
Citations number
13
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Journal of magnetism and magnetic materials → ACNP
ISSN journal
03048853
Volume
127
Issue
1-2
Year of publication
1993
Pages
129 - 134
Database
ISI
SICI code
0304-8853(1993)127:1-2<129:RASBIC>2.0.ZU;2-T
Abstract
Magnetic resonance measurements over wide ranges of frequency (3-35 GH z) and temperature (4-150 K) have been used to characterize the magnet ic phases of CdCr2-xInxSe4.