CR METALLIZATION OF POLYPHENYLACETYLENE THIN-FILM INVESTIGATED BY XPS

Citation
G. Polzonetti et al., CR METALLIZATION OF POLYPHENYLACETYLENE THIN-FILM INVESTIGATED BY XPS, Chemical physics letters, 214(3-4), 1993, pp. 333-337
Citations number
20
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
Journal title
ISSN journal
00092614
Volume
214
Issue
3-4
Year of publication
1993
Pages
333 - 337
Database
ISI
SICI code
0009-2614(1993)214:3-4<333:CMOPTI>2.0.ZU;2-S
Abstract
The early stages of Cr/polyphenylacetylene (PPA) interface formation h ave been investigated by means of X-ray photoemission spectroscopy (XP S). The core level C 1s and Cr 2p3/2 spectra of the substrate and of t he metal respectively, recorded at a constant metal evaporation rate, suggest the formation of a charge-transfer complex involving the pi-co njugated chain carbons mainly, while a weak interaction with the aroma tic carbons of the phenyl group occurs at initial Cr coverages (0.5-3 angstrom). The growth-mode of Cr on PPA seems to proceed at first by m etal monolayer deposition followed by cluster formation.