Rb. Watson, CALIBRATION TECHNIQUES FOR EXTENSOMETRY - POSSIBLE STANDARDS OF STRAIN-MEASUREMENT, Journal of testing and evaluation, 21(6), 1993, pp. 515-521
The search for an adequate reference strain measuring technique for us
e in the materials testing laboratory has spanned several decades. Ear
ly methods relied on properly calibrated extensometers. Two examples a
re Tuckerman's Optical Strain Gage and Bergqvist's highly refined indu
ctive and strain gage based extensometers. Length standards were used
to calibrate these devices. Initially, mechanical displacement mechani
sms were used as extensometer checking devices, but with the advent of
lasers, the Michelson interferometer has become a dominant displaceme
nt measuring tool. Advances in stabilizing hardware and electronic det
ectors have led to the availability of Michelson systems with a resolu
tion better than 5 nm. Microelectronics manufacturing techniques have
been used to replicate entire Michelson systems on a silicon chip. Adv
ances in detector technology have also led to interferometric linear e
ncoders with resolutions commensurate to classical interferometers. Ne
w techniques are being developed that can report strain and do not req
uire initial calibration by displacement measuring instruments. Moire
interferometry, using a reference grating frequency of 2400 lines/mm,
has many valuable traits for providing laboratory strain measurements
traceable to the National Institute for Standards and Technology (NIST
). Experience with strain calibration by moire indicates a measurement
uncertainty of less than 0.1%, corresponding to an accuracy of better
than 1 mu m/m. Bonded metallic electrical resistance strain gages pos
sess essentially limitless resolution, but accuracy must be establishe
d. When properly calibrated, bonded strain gages operating within thei
r elastic range could serve as Class A extensometers. This paper revie
ws some of the more interesting approaches from the past, analyzes som
e current methods being investigated, and comments on possibilities fo
r the future concerning the difficult task of finding a suitable calib
ration technique for use with strain measuring devices.