INPLANE DISPLACEMENT MEASUREMENT CONFIGURATION WITH TWOFOLD SENSITIVITY

Authors
SIROHI RS MOHAN NK
Citation
Rs. Sirohi et Nk. Mohan, INPLANE DISPLACEMENT MEASUREMENT CONFIGURATION WITH TWOFOLD SENSITIVITY, Applied optics, 32(31), 1993, pp. 6387-6390
Citations number
7
Categorie Soggetti
Optics
Journal title
Applied optics → ACNP
ISSN journal
00036935
Volume
32
Issue
31
Year of publication
1993
Pages
6387 - 6390
Database
ISI
SICI code
0003-6935(1993)32:31<6387:IDMCWT>2.0.ZU;2-Y
Abstract
An optical configuration is suggested that will achieve a twofold incr ease in sensitivity when one measures an in-plane displacement compone nt of a deformation vector compared with the Leendertz two-beam illumi nation method. A theory and experimental demonstration of the method a re presented.