STRUCTURAL ARRANGEMENT OF LAYERS IN SOME OCTAORGANYLSILSESQUIOXANES

Thick (similar to 0.2-1 mu m) layers of octaorganylsilsesquioxanes [RS iO(1.5)](8), where R is CH3, C2H3, and C2H5, were obtained by vacuum d eposition and studied by X-ray diffractometry (DRON-3M, R=192 mm, CuKa lpha radiation). Irrespective of the type of support, the layers are i deally oriented polycrystalline films with the [001] texture axis. Str uctural arrangement of the layers is analyzed on the basis of the crys tal data. Orientation of the terminal atomic groups on the surface of the layer is established It is shown that it is possible to adjust the scale of the layer pattern Two-layer compositions - Cu(II) beta-diket onates and phthaloyanines on octaorganylsilsesquioxane supports and vi ce versa - with preserved orientations of the films were obtained.