RECENT DEVELOPMENTS IN SCANNING-TUNNELING-MICROSCOPY

Scanning tunneling microscopy and related local probe methods have led to a novel perception of nanometer- and atomic-scale structures and p rocesses. Since the structural information is obtained directly in rea l space, the scanning probe techniques offer considerable advantages c ompared with diffraction techniques for the investigation of non-perio dic structures at solid surfaces. In addition, the local probe methods allow to study almost any kind of physical property of microstructure s with submicron down to atomic resolution.