DETERMINATION OF THE PROPAGATION LENGTH OF SURFACE-PLASMONS WITH THE SCANNING TUNNELING MICROSCOPE

Authors
THOST JP KRIEGER W KROO N SZENTIRMAY Z WALTHER H
Citation
Jp. Thost et al., DETERMINATION OF THE PROPAGATION LENGTH OF SURFACE-PLASMONS WITH THE SCANNING TUNNELING MICROSCOPE, Optics communications, 103(3-4), 1993, pp. 194-200
Citations number
18
Categorie Soggetti
Optics
Journal title
Optics communications → ACNP
ISSN journal
00304018
Volume
103
Issue
3-4
Year of publication
1993
Pages
194 - 200
Database
ISI
SICI code
0030-4018(1993)103:3-4<194:DOTPLO>2.0.ZU;2-Z
Abstract
A scanning tunneling microscope is used to measure the propagation len gth of surface plasmons generated on thin silver and gold films by las er radiation with wavelengths of 633 nm and between 2.4 and 2.8 mum, r espectively. From the values obtained the optical constants of the met al films at the corresponding wavelengths are determined. A decrease o f the propagation length observed at wavelengths larger than 2.6 mum i s explained by the presence of a water layer adsorbed on the gold film at ambient air pressure.