X-RAY PHOTOELECTRON-SPECTROSCOPY AND X-RAY-DIFFRACTION STUDIES OF ZN1-XCOXS DILUTED MAGNETIC SEMICONDUCTOR CRYSTALS

Citation
K. Lawniczakjablonska et al., X-RAY PHOTOELECTRON-SPECTROSCOPY AND X-RAY-DIFFRACTION STUDIES OF ZN1-XCOXS DILUTED MAGNETIC SEMICONDUCTOR CRYSTALS, Acta Physica Polonica. A, 84(4), 1993, pp. 633-636
Citations number
13
Categorie Soggetti
Physics
Journal title
ISSN journal
05874246
Volume
84
Issue
4
Year of publication
1993
Pages
633 - 636
Database
ISI
SICI code
0587-4246(1993)84:4<633:XPAXSO>2.0.ZU;2-K
Abstract
X-ray Photoelectron spectroscopy and powder X-ray diffraction studies of diluted magnetic semiconducting alloys Zn1-xCoxS, in the compositio n range 0 less-than-or-equal-to x less-than-or-equal-to 0.18, were per formed. The analysis of XPS spectra has shown that admixture of Co int o ZnS lattice does not affect the shape and position of Zn 2p core lev el, whereas certain modification of the S 2p peak shape was observed. The detected binding energy of Co indicated similarity between Co-S an d Co-O bond structure. Significant contributions of Co 3d7 electrons t o the valence band density of states were revealed.