O. Lacroix et al., ULTRA-THIN LAYER ACTIVATION BY RECOIL IMPLANTATION OF RADIOACTIVE HEAVY-IONS - APPLICABILITY IN WEAR AND CORROSION STUDIES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 122(2), 1997, pp. 262-268
A new calibration procedure is proposed for the application of recoil
implantation of radioactive heavy ions (enegies between a few hundred
keV and a few MeV) into the near surface of materials as part of a res
earch programme on submicrometric wear or corrosion phenomena. The dep
th profile of implanted radioelements is performed by using ultra thin
deposited films obtained by cathode sputtering under argon plasma. Tw
o curves for Co-56 ion in nickel have been determined for implantation
depths of 110 and 200 nm, respectively, and stress the feasibility an
d reproductibility of this method for such activated depths. The achie
ved surface loss detection sensitivities are about 1 and 2 nm respecti
vely. The on line detection mode is performed directly on the sample o
f interest. A general description of the method is presented. A study
of the reaction kinematics followed by a general treatment on the irra
diation parameters to be adopted are also developed with the intention
of using the ultra thin layer activation method (UTLA) to further app
lications in research and industry.