PHYSICAL AND CHEMICAL-ANALYSIS OF RF-SPUTTERED CU TE/CDTE STRUCTURES/

Authors
DEBBAGH F MOHSSINE H AMEZIANE EL AZIZAN M BRUNEL M
Citation
F. Debbagh et al., PHYSICAL AND CHEMICAL-ANALYSIS OF RF-SPUTTERED CU TE/CDTE STRUCTURES/, Solar energy materials and solar cells, 31(1), 1993, pp. 1-8
Citations number
25
Categorie Soggetti
Energy & Fuels","Material Science
Journal title
Solar energy materials and solar cells → ACNP
ISSN journal
09270248
Volume
31
Issue
1
Year of publication
1993
Pages
1 - 8
Database
ISI
SICI code
0927-0248(1993)31:1<1:PACORC>2.0.ZU;2-T
Abstract
Physical and chemical properties of Cu/Te/CdTe structures are studied by means of both grazing incidence X-ray diffraction and XPS technique s. Structural analysis shows that an interfacial reaction occurs betwe en Cu and Te layers leading to the formation of the stoichiometric Cu2 Te compound. The contact resistivity has been analyzed on the basis of Mott's model and taking into account the disordered nature of the Cu/ Te structure as well as the formed interfaces.