A NEUTRON-DIFFRACTION STUDY ON THE VERY NARROW DYNAMICAL WIDTH OF GAAS [200]

Citation
Kd. Liss et al., A NEUTRON-DIFFRACTION STUDY ON THE VERY NARROW DYNAMICAL WIDTH OF GAAS [200], Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 335(3), 1993, pp. 523-527
Citations number
11
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
ISSN journal
01689002
Volume
335
Issue
3
Year of publication
1993
Pages
523 - 527
Database
ISI
SICI code
0168-9002(1993)335:3<523:ANSOTV>2.0.ZU;2-I
Abstract
The energy resolution associated with a particular Bragg reflection is limited by the diffraction properties and by the quality of the mater ial. It can be derived from the structure factor within the dynamic th eory of diffraction for ideal crystals. Using the GaAs [200] reflectio n on a neutron backscattering spectrometer we could realize a resoluti on of Delta E=(43+/-5) neV. This is an improvement by about a factor o f 3 as compared to the value calculated for ideal Si [111] and by abou t a factor of 7 as compared to the best experimental energy resolution available of any crystal spectrometer.