Kd. Liss et al., A NEUTRON-DIFFRACTION STUDY ON THE VERY NARROW DYNAMICAL WIDTH OF GAAS [200], Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 335(3), 1993, pp. 523-527
The energy resolution associated with a particular Bragg reflection is
limited by the diffraction properties and by the quality of the mater
ial. It can be derived from the structure factor within the dynamic th
eory of diffraction for ideal crystals. Using the GaAs [200] reflectio
n on a neutron backscattering spectrometer we could realize a resoluti
on of Delta E=(43+/-5) neV. This is an improvement by about a factor o
f 3 as compared to the value calculated for ideal Si [111] and by abou
t a factor of 7 as compared to the best experimental energy resolution
available of any crystal spectrometer.