THERMAL-STRESS ANALYSIS AND DIFFRACTION SIMULATION OF A STANDARD AND INCLINED GALLIUM-COOLED HIGH-HEAT-LOAD X-RAY MONOCHROMATOR

Citation
Cs. Rogers et At. Macrander, THERMAL-STRESS ANALYSIS AND DIFFRACTION SIMULATION OF A STANDARD AND INCLINED GALLIUM-COOLED HIGH-HEAT-LOAD X-RAY MONOCHROMATOR, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 335(3), 1993, pp. 561-568
Citations number
23
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
ISSN journal
01689002
Volume
335
Issue
3
Year of publication
1993
Pages
561 - 568
Database
ISI
SICI code
0168-9002(1993)335:3<561:TAADSO>2.0.ZU;2-R
Abstract
This paper describes the methods used to calculate the thermally induc ed deformations in symmetrically cut, standardly configured and inclin ed monochromator crystals using finite element analysis. The results o f these analyses are compared to recent undulator experiments conducte d at the Cornell High Energy Synchrotron Source (CHESS) using a high-p erformance, liquid-gallium-cooled silicon crystal. The modeling was ca rried out for a range of machine currents, and the calculated locking curve widths were within 10% of the experimental values. The asymmetri c shape of the rocking curves at high currents was also predicted. The se results lend credibility to our assertion that computer simulations can be used to reliably and accurately predict the performance of hig h-heat-load X-ray optics for future synchrotron sources.