Mm. Faye et al., SIMULATION OF LATERAL AL RECOIL ATOMS AND DAMAGE DEFECTS GRADIENTS INA GAAS GAALAS QUANTUM-WELL CREATED BY MASKED ION-IMPLANTATION/, Materials science & engineering. B, Solid-state materials for advanced technology, 21(2-3), 1993, pp. 284-287
We have studied through computer simulations the effects of Ga+ ion im
plantation through masked GaAlAs/GaAs/GaAlAs heterostructures presenti
ng one single quantum well. The spatial distribution of the Al atoms r
esponsible for the energy gap modifications has been calculated. Depth
and lateral profiles in the quantum well of the Al recoil atoms extra
cted from the two dimensional distribution have elicited different typ
es of situations encountered in collision mixing experiments. Finally,
this work shows that computer simulation is of great importance for s
electing the parameters to realize lateral nano-structures such as qua
ntum wires or dots.