SIMULATION OF LATERAL AL RECOIL ATOMS AND DAMAGE DEFECTS GRADIENTS INA GAAS GAALAS QUANTUM-WELL CREATED BY MASKED ION-IMPLANTATION/

Citation
Mm. Faye et al., SIMULATION OF LATERAL AL RECOIL ATOMS AND DAMAGE DEFECTS GRADIENTS INA GAAS GAALAS QUANTUM-WELL CREATED BY MASKED ION-IMPLANTATION/, Materials science & engineering. B, Solid-state materials for advanced technology, 21(2-3), 1993, pp. 284-287
Citations number
9
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
09215107
Volume
21
Issue
2-3
Year of publication
1993
Pages
284 - 287
Database
ISI
SICI code
0921-5107(1993)21:2-3<284:SOLARA>2.0.ZU;2-D
Abstract
We have studied through computer simulations the effects of Ga+ ion im plantation through masked GaAlAs/GaAs/GaAlAs heterostructures presenti ng one single quantum well. The spatial distribution of the Al atoms r esponsible for the energy gap modifications has been calculated. Depth and lateral profiles in the quantum well of the Al recoil atoms extra cted from the two dimensional distribution have elicited different typ es of situations encountered in collision mixing experiments. Finally, this work shows that computer simulation is of great importance for s electing the parameters to realize lateral nano-structures such as qua ntum wires or dots.