TRANSMISSION ELECTRON-MICROSCOPY OF SURFACES AND INTERFACES

Authors
BUFFAT PA CATANA A FLUELI M GANIERE JD ROSENFELD D STADELMANN P VERDON C
Citation
Pa. Buffat et al., TRANSMISSION ELECTRON-MICROSCOPY OF SURFACES AND INTERFACES, Analusis, 21(8), 1993, pp. 130000006
Citations number
10
Categorie Soggetti
Chemistry Analytical
Journal title
Analusis → ACNP
ISSN journal
03654877
Volume
21
Issue
8
Year of publication
1993
Database
ISI
SICI code
0365-4877(1993)21:8<130000006:TEOSAI>2.0.ZU;2-0
Abstract
Modern transmission electron microscopes offer imaging capabilities do wn to the atomic lattice resolution, as well as crystallographic and c hemical microanalysis with 2-nanometer diameter probes in thin foils. These analytical microscopes are powerful tools for surface, interface and thin films studies.