CHARACTERIZATION OF SURFACE-TOPOGRAPHY BY SCANNING PROBE MICROSCOPY

Authors
ROSSET E
Citation
E. Rosset, CHARACTERIZATION OF SURFACE-TOPOGRAPHY BY SCANNING PROBE MICROSCOPY, Analusis, 21(8), 1993, pp. 130000023-130000024
Citations number
4
Categorie Soggetti
Chemistry Analytical
Journal title
Analusis → ACNP
ISSN journal
03654877
Volume
21
Issue
8
Year of publication
1993
Pages
130000023 - 130000024
Database
ISI
SICI code
0365-4877(1993)21:8<130000023:COSBSP>2.0.ZU;2-T
Abstract
Characterizing a surface has always been of a key interest since its i nfluence on the properties of a system has been recognized. It is quit e surprising that we only start to have the tools to access and modeli ze the most visible and apparently the most accessible part of a syste m: its surface topography.