MULTIPLE-FAULT ANALOG CIRCUIT TESTING BY SENSITIVITY ANALYSIS

Analog circuit testing is considered to be a very difficult task. This difficulty is mainly due to the lack of fault models and accessibilit y to internal nodes. To overcome this problem, an approach is presente d for analog circuit modeling and testing. The circuit modeling is bas ed on first-order sensitivity computation. The testability of the circ uit is analyzed by the multiple-fault model and by functional testing. Component deviations are deduced by measuring a number of output para meters, and through sensitivity analysis and tolerance computation. Us ing this approach, adequate tests are identified for testing catastrop hic and soft faults. Some experimental results are presented for simpl e models as well as multiple-fault models.