M. Volcker et al., DETECTION OF LOCAL CONDUCTIVITY BY LASER-FREQUENCY MIXING IN A SCANNING FORCE MICROSCOPE, Journal of applied physics, 74(9), 1993, pp. 5426-5431
Coupling of laser radiation into a conducting tip of a scanning force
microscope allows one to distinguish between conducting and nonconduct
ing parts of a sample. This is demonstrated for a pattern of small met
al islands on a nonconducting BaF2 substrate. In the experiment two in
frared laser beams are coupled into the tip. The difference frequency
is generated in the tip-sample junction, emitted, and detected by mean
s of an open waveguide. Images with this signal are recorded simultane
ously with the topography. Difference-frequency generation is observed
only on conducting parts of the surface and at islands larger than ab
out 1 mum in diameter. The size of the conducting island as well as th
e tunneling distance between the tip and conducting surface determine
the magnitude of the difference-frequency signal. Frequency mixing of
visible laser light, using the excitation of localized plasmons for fi
eld enhancement, may lead to the detection of local conductivity on mu
ch smaller structures.