J. Sadowski et al., HARD HETEROEPITAXY ON 2-DEGREES OFF-ORIENTED GAAS (100) SUBSTRATES .1. THE OCCURRENCE OF (100) AND (111) SURFACE ORIENTATIONS IN MBE-GROWN PBTE FILMS, Crystal research and technology, 28(7), 1993, pp. 909-918
The MBE growth of PbTe layers on GaAs (100) 2-degrees off-oriented sub
strates belongs to hard heteroepitaxy, because the two materials diffe
r strongly in their lattice constants and, in addition, they also exhi
bit different crystal structures. Consequently, phases with different
surface orientations may occur in MBE-grown PbTe epilayers. Two crysta
llographic orientations, i.e. (100) and (111), have been found in the
PbTe epilayers grown by MBE on these off-oriented substrates. X-ray di
ffraction and reflection high energy electron diffraction (RHEED) meas
urements applied as post growth characterization techniques allow to i
dentify which orientation is prevailing in films grown at different MB
E conditions. It has been shown that the occurrence of the (100) and (
111) orientations in MBE-grown PbTe epilayers depends mainly on the Ga
As substrate in situ preheating procedure. At higher preheating temper
ature and longer preheating time the (111) orientation prevails. This
finding is in accordance with the theoretical model of hard heteroepit
axy of CdTe on GaAs (100) substrates by GRIESCHE et al.