MATERIAL CHARACTERIZATION WITH A SIMPLE LASER-SCANNING MICROSCOPE

Citation
R. Krug et al., MATERIAL CHARACTERIZATION WITH A SIMPLE LASER-SCANNING MICROSCOPE, Applied optics, 32(32), 1993, pp. 6458-6463
Citations number
9
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
32
Issue
32
Year of publication
1993
Pages
6458 - 6463
Database
ISI
SICI code
0003-6935(1993)32:32<6458:MCWASL>2.0.ZU;2-O
Abstract
The design of a computer-controlled laser scanning microscope is descr ibed. It is capable of inspecting a 1 mm x 1 mm area in less than 1 s with an optical resolution of 2 mum. Three applications of the laser s canning microscope are presented: the observation of the ferroelectric -domain structure of sodium nitrite layers, the observation of the spa tial distribution of the photocurrent in polycrystalline solar cells, and the observation of the lateral distribution of thermoelectric curr ents in a thermal IR detector for the determination of the thermal pro perties of its absorber foil.