PHOTON TUNNELING MICROSCOPY OF POLYMERIC SURFACES

With photon tunneling microscopy it is possible to image polymeric and other dielectric surfaces by means of the unusual properties of photo n tunneling or evanescent waves. Vertical resolution is 1 nanometer, l imited by the detector, over a vertical range of half a wavelength. La teral resolution is better than a quarter of a wavelength over a field of view up to 125 micrometers. Samples can be surveyed in real time i n air, with no need for metallization, and without shadowing or the in trusive effects of electrons or scanning probes. The use of this techn ique to study single crystals of polyethylene and processes such as la tex film formation and the evolution of polystyrene topography while d ewetting above the glass transition temperature are described.