STRENGTH AND TOUGHNESS MEASUREMENT OF THIN BRITTLE COATINGS ON SUBSTRATES .1. THEORY AND MEASUREMENT

Citation
Jh. Selverian et D. Oneil, STRENGTH AND TOUGHNESS MEASUREMENT OF THIN BRITTLE COATINGS ON SUBSTRATES .1. THEORY AND MEASUREMENT, Thin solid films, 235(1-2), 1993, pp. 120-128
Citations number
12
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
235
Issue
1-2
Year of publication
1993
Pages
120 - 128
Database
ISI
SICI code
0040-6090(1993)235:1-2<120:SATMOT>2.0.ZU;2-7
Abstract
Conventional mechanical property measurement techniques usually cannot be applied to ceramic thin films because of the small amount of mater ial involved. A method is described to determine the ultimate tensile strength, fracture toughness, Weibull modulus, and surface energy of m icron-sized ceramic films on substrates. This technique is based on me asuring the radius of curvature of a coated substrate at room temperat ure, and equating the resulting calculated stress with a theoretical s hear-lag stress distribution model using a force balance.