COMPACTION OF TUNGSTEN-OXIDE FILMS BY ION-BEAM IRRADIATION

Citation
W. Wagner et al., COMPACTION OF TUNGSTEN-OXIDE FILMS BY ION-BEAM IRRADIATION, Thin solid films, 235(1-2), 1993, pp. 228-233
Citations number
24
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
235
Issue
1-2
Year of publication
1993
Pages
228 - 233
Database
ISI
SICI code
0040-6090(1993)235:1-2<228:COTFBI>2.0.ZU;2-2
Abstract
Evaporated amorphous tungsten oxide films with low densities, deposite d on different substrates, have been irradiated with various types of ions of different energies up to 30 MeV, and With fluences up to 10(18 ) cm-2. Compaction of the films up to nearly the bulk density was obse rved. No changes of the stoichiometry as determined by various ion-bea m analysis techniques were detectable. Raman measurements showed that ion-beam-modified films are also amorphous, but have a different micro structure from as-deposited films. The irradiated films have a higher refractive index than the as-deposited films. A low threshold for the compaction effect of a few times 10(12) ions cm-2 was found, leading t o the conclusion that one ion displaces more than 10(5) tungsten oxide molecules.