Evaporated amorphous tungsten oxide films with low densities, deposite
d on different substrates, have been irradiated with various types of
ions of different energies up to 30 MeV, and With fluences up to 10(18
) cm-2. Compaction of the films up to nearly the bulk density was obse
rved. No changes of the stoichiometry as determined by various ion-bea
m analysis techniques were detectable. Raman measurements showed that
ion-beam-modified films are also amorphous, but have a different micro
structure from as-deposited films. The irradiated films have a higher
refractive index than the as-deposited films. A low threshold for the
compaction effect of a few times 10(12) ions cm-2 was found, leading t
o the conclusion that one ion displaces more than 10(5) tungsten oxide
molecules.