OPTICAL-ABSORPTION IN POROUS SILICON OF HIGH-POROSITY

Citation
V. Grivickas et P. Basmaji, OPTICAL-ABSORPTION IN POROUS SILICON OF HIGH-POROSITY, Thin solid films, 235(1-2), 1993, pp. 234-238
Citations number
25
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
235
Issue
1-2
Year of publication
1993
Pages
234 - 238
Database
ISI
SICI code
0040-6090(1993)235:1-2<234:OIPSOH>2.0.ZU;2-1
Abstract
We report IR and absorption edge spectra of porous silicon (PS), cover ing a porosity range where the average size of the domains is comparab le with the pore radius. There are two distinct IR absorption groups r elated to degree of specimen ''aging'' and porosity; these can be attr ibuted to CH(i), H(C(j)H(i)) and to SiO(m), Si(OH(i)) bond vibrations. The last two dominate in high porosity specimens. The absorption edge spectra can be deconvoluted into a band-to-deep state absorption at c ongruent-to 1 eV and a parabolic band-to-band absorption, with energy gap E(g) = 1.6-2 eV and an absorption shoulder at hv less-than-or-equa l-to E(g). The optical density of bands is significantly reduced for p orosity above 70%. Optical parameters of an absorption shoulder correl ate approximately with photoluminescence spectra and the strength of C H(i) and H(C(j)H(i)) vibrations.