OPTICALLY DETECTED MAGNETIC-RESONANCE STUDIES OF DEFECTS IN ELECTRON-IRRADIATED 3C SIC LAYERS

Citation
Nt. Son et al., OPTICALLY DETECTED MAGNETIC-RESONANCE STUDIES OF DEFECTS IN ELECTRON-IRRADIATED 3C SIC LAYERS, Physical review. B, Condensed matter, 55(5), 1997, pp. 2863-2866
Citations number
19
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
55
Issue
5
Year of publication
1997
Pages
2863 - 2866
Database
ISI
SICI code
0163-1829(1997)55:5<2863:ODMSOD>2.0.ZU;2-9
Abstract
Defects in electron-irradiated 3C SiC were studied by optically detect ed magnetic resonance (ODMR). In addition to the isotropic L2 center p reviously reported, an ODMR spectrum labeled L3, with a trigonal symme try and an effective electron spin S=1, was observed after annealing a t similar to 750 degrees C. The g values of the center along and perpe ndicular to the trigonal axis were determined as g(parallel to)=2.0041 and g(perpendicular to)=2.0040. The anisotropy of the spectrum is acc ounted for by the spin-spin interaction with a crystal-field splitting value D=4.2X10(-2) cm(-1). From a spectral dependence study of the OD MR signal, the defect is found to be related to a photoluminescence ba nd in the near midgap region. The defect is likely a complex involving a silicon vacancy and another intrinsic defect as suggested from its trigonal symmetry and annealing behavior.