The role of hydrogen in gallium nitride was studied on thin Films of G
aN on sapphire prepared at substrate temperatures in the range of 600
to 1100 degrees C. By using triethylgallium and ammonia as precursor a
nd hydrogen and/or nitrogen as transport gases, we have observed a str
ong influence of molecular hydrogen on the deposition rate and the str
uctural properties of epitaxial GaN. By elastic recoil detection analy
sis and thermal desorption measurements we were able to determine the
total concentration of nitrogen, hydrogen and carbon in the bulk mater
ial. Isotope substitution of hydrogen by deuterium in the H-2 carrier
gas did not give rise to a noticeable deuterium incorporation, showing
that the sources for hydrogen are the metalorganic precursor, ammonia
or reaction products of both. Once incorporated: thermally activated
hydrogen effusion from n-type GaN occurs with an activation energy of
more than 3.9 eV. With the help of mass spectrometry we established hy
drogen effusion from heavily magnesium-doped (2 at%) GnN at temperatur
es between 600 and 700 degrees C, which is the temperature range used
for acceptor activation.