B. Melody et T. Kinard, PHOTOGRAPHIC EVIDENCE OF DELAMINATION OF 2-LAYER STRUCTURE OF ANODIC OXIDE-FILMS ON TANTALUM FORMED IN ELECTROLYTES CONTAINING PHOSPHATE, Journal of the Electrochemical Society, 140(11), 1993, pp. 120000162-120000162
Direct photographic evidence of delamination of the two-layer film str
ucture for anodic tantalum oxide films formed in phosphate-containing
electrolytes has been discovered in scanning electron microscopy photo
micrographs of flaws in the anodic oxide. The amorphous dielectric oxi
de, whose bi-layer structure was suggested by Vermilyea et al., appear
s to have been displaced from the site of crystalline oxide growth and
to have undergone layer delamination as a result of the large mechani
cal stresses present.