QUANTITATIVE-ANALYSIS OF MICROSTRUCTURE O F SELF-REINFORCED SILICON-NITRIDE CERAMICS

Citation
N. Hirosaki et al., QUANTITATIVE-ANALYSIS OF MICROSTRUCTURE O F SELF-REINFORCED SILICON-NITRIDE CERAMICS, Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 101(11), 1993, pp. 1239-1243
Citations number
15
Categorie Soggetti
Material Science, Ceramics
ISSN journal
09145400
Volume
101
Issue
11
Year of publication
1993
Pages
1239 - 1243
Database
ISI
SICI code
0914-5400(1993)101:11<1239:QOMOFS>2.0.ZU;2-3
Abstract
Beta-Si3N4 powders containing 0.5 mol% Y2O3 and 0.5 mol% Nd2O3 were ga s-pressure sintered at 2000-degrees-C for 2, 4, and 8h. The obtained m aterials presented the microstructure of self-reinforced composites co nsisting of some large rod-like grains in a fine matrix, as it was obs erved by scanning electron microscopy of plasma-etched surfaces. Two-d imensional distributions of grain diameter, grain length, and cross-se ctional area were quantitatively analyzed using an image analyzer. The distribution curve of grain number and grain cross-sectional area did not reflect the presence of large grains, and therefore this method i s not suitable for evaluation of self-reinforced materials. The volume fractions of large grains and fine matrix grains were estimated from the relation between the grain size and the two-dimentional distributi on curve of grain cross-sectional area.