Detection limits of about 1 g/m2 are demonstrated for the Raman determ
ination of two organic materials, polydimethylsiloxane and dimethyl me
thylphosphonate, on an aluminum surface. A fiber-optic-based system is
used. A large sample area is scanned to overcome heterogeneity in sam
ple coverage. Measurements are made without use of an internal standar
d. Results are reported for both a Hadamard transform technique with a
rgon-ion laser excitation and a conventional spectrometer with diode l
aser excitation.