DETERMINATION OF ORGANICS ON METAL-SURFACES BY RAMAN-SPECTROSCOPY

Citation
Ch. Tseng et al., DETERMINATION OF ORGANICS ON METAL-SURFACES BY RAMAN-SPECTROSCOPY, Applied spectroscopy, 47(11), 1993, pp. 1767-1771
Citations number
8
Categorie Soggetti
Instument & Instrumentation",Spectroscopy
Journal title
ISSN journal
00037028
Volume
47
Issue
11
Year of publication
1993
Pages
1767 - 1771
Database
ISI
SICI code
0003-7028(1993)47:11<1767:DOOOMB>2.0.ZU;2-C
Abstract
Detection limits of about 1 g/m2 are demonstrated for the Raman determ ination of two organic materials, polydimethylsiloxane and dimethyl me thylphosphonate, on an aluminum surface. A fiber-optic-based system is used. A large sample area is scanned to overcome heterogeneity in sam ple coverage. Measurements are made without use of an internal standar d. Results are reported for both a Hadamard transform technique with a rgon-ion laser excitation and a conventional spectrometer with diode l aser excitation.