V. Nadazdy et al., EVIDENCE FOR THE IMPROVED DEFECT-POOL MODEL FOR GAP STATES IN AMORPHOUS-SILICON FROM CHARGE DLTS EXPERIMENTS ON UNDOPED A-SI-H, Physical review letters, 78(6), 1997, pp. 1102-1105
Results of the first charge deep level transient spectroscopy (DLTS) m
easurements on undoped a-Si:H are presented. The ability of the charge
DLTS technique to resolve the gag-state distribution and to monitor d
irectly its evolution after preequilibrium preparation by bias anneali
ng is demonstrated. Three groups of gap states with mean energies of 0
.63, 0.82, and 1.25 eV are observed. The condition for their creation
as well as the energy values are in a good agreement with the D+, D-0,
and D- states of the improved defect-pool model.